TRANSPARENT BIST FOR RAMS

Efficient Algorithms for Testing Semiconductor Random-Access Memories

Nair, Thatte, Abraham · IEEE Transactions on Computers · 1978 · 201 citations

Engineering, Computer Engineering, Computer Science +16

A March Test for Functional Faults in Semiconductor Random Access Memories

Suk Suk, Reddy · IEEE Transactions on Computers · 1981 · 194 citations

Engineering, Computer Engineering, Computer Science +11

Simple and Efficient Algorithms for Functional RAM Testing.

Marian Marinescu · International Test Conference · 1982 · 170 citations

Computing, Computer Engineering, Computer Science +7

Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories

Suk Suk, Reddy · IEEE Transactions on Computers · 1980 · 113 citations

Engineering, Computer Engineering, Electrical Engineering +13

Testing Memories for Single-Cell Pattern-Sensitive Faults

Hayes · IEEE Transactions on Computers · 1980 · 107 citations

Engineering, Computer Engineering, Computer Science +11