Measurement of the error rate of single flux quantum circuits with high temperature superconductors

Abstract

The determination of bit error rates in single flux quantum logic circuits operating at temperatures well above the temperature of liquid helium is essential since the question of stability against thermal noise arises. We determined experimentally the static and for the first time the dynamic error rate at temperatures of about 40 K with the help of simple test circuits. The static error rate has been investigated using two different circuits with bicrystal junctions in either single-layer or multilayer configuration. In both cases the internal state of a storage loop was observed by a dc-SQUID. A ring oscillator based on a Josephson transmission line allowed us to measure the dynamic error rate of a Josephson comparator at high frequencies. This circuit has been fabricated using junctions by focused-electron-beam irradiation. It is specially suited for the detection of seldom occurring switching errors.