LAYIN: toward a global solution for parasitic coupling modeling and visualization

Abstract

A CAD tool dedicated to parasitic substrate coupling modeling and visualization is presented. A CIF representation of the layout and a specific technology description are used to extract a simple parasitic substrate coupling model. The output is SPICE compatible and includes a geometrical information that is used to show on the layout the distribution of the equipotential lines produced by a perturbing source. Results are compared with measurements and other simulators to demonstrate the accuracy of the model.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>