An 11-Bit 45 MS/s Pipelined ADC With Rapid Calibration of DAC Errors in a Multibit Pipeline Stage

Abstract

A technique to rapidly correct for both DAC and gain errors in the multibit first stage of an 11-bit pipelined ADC is presented. Using a dual-ADC based approach the digital background scheme is validated with a proof-of-concept prototype fabricated in a 1.8 V 0.18 CMOS process, where the calibration scheme improves the peak INL of the 45 MS/s ADC from 6.4 LSB to 1.1 LSB after calibration. The SNDR/SFDR is improved from 46.9 dB/48.9 dB to 60.1 dB/70 dB after calibration. Calibration is achieved in approximately 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sup> clock cycles.