Using a new bathtub curve to correlate quality and reliability

Integrated circuit yield statistics

C.H. Stapper, F.M. Armstrong, K. Saji · Proceedings of the IEEE · 1983 · 405 citations

Engineering, Industrial Engineering, Integrated Circuit Manufacturing +16

Modeling of Integrated Circuit Defect Sensitivities

C.H. Stapper · IBM Journal of Research and Development · 1983 · 282 citations

Defect Tolerance, Electrical Engineering, Reliability Engineering +15

Impact of screening of latent defects at electrical test on the yield-reliability relation and application to burn-in elimination

J.A. van der Pol, E.R. Ooms, T. Van 't Hof et al. · 1998 · 44 citations

Latent Defects, Engineering, Electrical Test +16

Characterization of the time-dependent reliability fallout as a function of yield for a 130nm SRAM device and application to optimize production burn-in

Keith Forbes, P. Schani · 2004 · 16 citations

Engineering, Computer Architecture, System Reliability +19