Applied Optics · 1979 · 79 citations · 14 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials ChemistryOptical MaterialsSurface ScienceCoatingsOptical Thin FilmsRefractive IndexThin Film Optical PropertiesIndex Of Refraction MeasurementOptical CoatingsRefractive Index DispersionRefractive Index EngineeringRefractometryThin-film Refractive Index
Spectroreflectometry was used to measure the refractive index of the following optical coating materials: Ta(2)O(5), HfO(2), Y(2)0(3), La(2)O(3), ZrO(2), CeO(2), CeF(3), LaF(3), NdF(3), MgF(2) in the 250-2000-nm spectral range.
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A Rapidly Convergent Descent Method for Minimization
R. Fletcher, M. J. D. Powell · The Computer Journal · 1963 · 4.6K citations · Full text