Characterisation of partial discharge pulses in artificial voids in polypropylene films used in capacitors

Abstract

Partial discharges in voids may cause deterioration of solid insulating materials. They often start in voids enclosed in insulation and or at the interface defects. A method of measuring fast discharge pulses with rise times below 1 ns is reported. Characterisation of partial discharge pulses in artificial voids in polypropylene films at atmospheric pressure is analysed that incorporates inception voltage, apparent and real charge, drift velocity and mobility of electrons.