IEEE Journal of Quantum Electronics · 1991 · 196 citations · 18 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsIii-v SemiconductorsLaser DiodesLaser PhysicsOptical Properties Of SemiconductorsSemiconductor Device MaterialsSemiconductor LasersCurrent DensityEfficiencyExternal Quantum EfficiencyLaser MaterialsLasersOptical Gain In SemiconductorsSemiconductor Laser FabricationVertical-cavity Surface-emitting Lasers
The authors give theoretical and experimental results for vertical-cavity surface-emitting lasers (VCSELs). The modeling is applied to the design of InGaAs VCSELs. A simple method to calculate the reflectivity of semiconductor stack mirrors with graded interfaces and compound metal/semiconductor stack mirrors is introduced. The theoretical predictions are compared to results from actual device measurements. A novel technique is introduced to determine material parameters: fabrication of in-plane lasers from VCSEL material. The procedure used to determine the optical mode in such an in-plane laser is described. Using the insight gained from modeling, the external efficiency was increased to >30% with a threshold current density of 1 kA/cm/sup 2/.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Waves and Fields in Optoelectronics
M. Bertolotti · Optica Acta International Journal of Optics · 1985 · 1.5K citations
GaInAsP/InP Surface Emitting Injection Lasers
H. Soda, Kenichi Iga, Chiyuki Kitahara et al. · Japanese Journal of Applied Physics · 1979 · 544 citations
Refractive index of Ga1−xAlxAs
Martin A. Afromowitz · Solid State Communications · 1974 · 418 citations