High-Fidelity Transport of Trapped-Ion Qubits through an<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi mathvariant="bold">X</mml:mi></mml:math>-Junction Trap Array

Abstract

We report reliable transport of (9)Be(+) ions through an "X junction" in a 2D trap array that includes a separate loading and reservoir zone. During transport the ion's kinetic energy in its local well increases by only a few motional quanta and internal-state coherences are preserved. We also examine two sources of energy gain during transport: a particular radio-frequency noise heating mechanism and digital sampling noise. Such studies are important to achieve scaling in a trapped-ion quantum information processor.