IEEE Transactions on Applied Superconductivity · 1995 · 23 citations · 9 references
Natural SciencesElectrical EngineeringMaterials ScienceElectronic MaterialsMicrowave EngineeringThin FilmsDielectricsHigh-frequency Semiconductor DevicesMicrowave MaterialsSuperconducting Thin FilmsThin Film Electrical PropertiesThin-film MaterialsCharacterization Of Microwave MaterialsCritical Current DensityCurrent DensityMicrowave DevicesMicrowave Dielectric PropertiesMicrowave MetrologySurface ResistanceSurface Resistance Measurement
We have measured the microwave properties of high quality YBCO thin films using a copper cavity (87 GHz) and a dielectric resonator (19 GHz) for unpatterned films as well as a coplanar resonator (5, 8, 10, 15 and 16 GHz) for patterned films. For the patterned films the surface resistance (R/sub S/) and non-linear effects were studied as a function of temperature below T/sub C/. For practical applications, the assessment of non-linear effects in the surface resistance are of great importance. The best films showed R/sub S/ approximately constant up to microwave peak current densities of the order of the dc critical current density. The measurements were performed on samples fabricated by a number of different techniques.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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