Combining the FDTD Method and Rational-Fitting Techniques for Modeling Active Devices Characterized by Measured $S$-Parameters

Abstract

<para xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> Most extensions of the original finite-difference time-domain (FDTD) method to incorporate lumped components are based on equivalent-circuit models. However, for active components, most manufacturers provide only the measured <formula formulatype="inline"><tex>$S$</tex></formula>-parameters of the device. </para>