Journal of Lightwave Technology · 1991 · 73 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor DevicesOptical Properties Of SemiconductorsOptical Thin FilmsPhotodetectorsPhotonic MaterialsSemiconductor DetectorsThin Film Optical PropertiesDetector Quantum EfficiencyLight-absorbing LayersPhotodetectionPhotodetector MaterialsPhotodiodesQuantum EfficiencyResonance WidthSchottky Photodetectors
The spectral response of resonantly enhanced photodiodes is analyzed theoretically and verified experimentally. Comprehensive design guidelines and formulas are given for device structures containing a metal reflector, a contact layer, and optional grading layer, an absorbing layer, and a quarter-wave stack (QWS). The analysis shows, for instance, that the quantum efficiency of a Schottky photodiode with a 162-nm GaInAs absorbing layer can be enhanced 3.7-fold by using a 41-layer AlInAs/AlGaInAs QWS. The number of layers required could be much lower for other material systems and/or if the substrate is removed. Experimentally, 50% enhancement is demonstrated for a 475-nm-thick absorbing layer at 1.52 mu m by using a 16-layer QWS. The resonance width is approximately 4.4%.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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American Institute of Physics Handbook
Journal of the Optical Society of America · 1957 · 1.1K citations
Andrey V. Sokolov, J. C. Phillips · American Journal of Physics · 1968 · 529 citations
L. Ivan Epstein · Journal of the Optical Society of America · 1952 · 238 citations