Scaling of analog-to-digital converters into ultra-deep-submicron CMOS

Abstract

This paper presents the opportunities and challenges for scaling A/D converters into ultra-deep-submicron CMOS technologies. With faster transistors and better matching, the trend is to migrate into higher sample rates with lower resolutions. Limited dynamic range at low supply voltages remains the utmost challenge for high-resolution Nyquist converters, and oversampling will become the dominant technique in this arena in the future. Linearity correction with digital calibration is also becoming prevalent as the efficiency of calibration circuitry improves