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Partial discharge recognition through an analysis of SF<sub>6</sub> decomposition products part 1: decomposition characteristics of SF<sub>6</sub> under four different partial discharges
253
Citations
14
References
2012
Year
Artificial DefectsElectrical EngineeringPartial DischargeEngineeringOptical DiagnosticsGlow DischargeDifferent Partial DischargesPartial Discharge RecognitionPd DetectionSystems EngineeringProcess SafetyPulse PowerGas Discharge PlasmaExplosionsDecomposition CharacteristicsElectrical Insulation
Partial discharge (PD) is usually aroused before the failure of gas insulated switchgear (GIS) caused by defects, which results in the decomposition of the SF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sub> used as insulating gas. Analyzing SF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sub> decomposition products can aid in PD detection. Before recognizing PD types by analyzing SF6 decomposition products, the decomposition characteristics of SF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sub> under different types of PD should be investigated first. In this paper, a gas chamber and four typical types of artificial defects were designed to simulate the SF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sub> decomposition phenomenon under PD in GIS. A gas chromatography system was established to detect SF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sub> decomposition products. By selecting the chromatographic column, SF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sub> decomposition products were successfully separated and their concentrations were measured. Numerous SF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sub> decomposition experiments under four kinds of PD generated by four kinds of artificial defects were carried out and the SF6 decomposition products produced by each experiment were detected. The decomposition characteristics of SF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sub> under the four defects were different in terms of decomposition amount, generation rate, and concentration ratio, among others. It is feasible to recognize the type of PD by analyzing SF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sub> decomposition products.
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