On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials

X-ray line broadening from filed aluminium and wolfram

G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10.2K citations

Natural Sciences, Materials Science, Spectroscopy +5

X-ray diffraction procedures

Harold P. Klug, Leroy Alexander · CERN Document Server (European Organization for Nuclear Research) · 1954 · 4.2K citations

Nanocrystalline materials

H. Gleiter · Progress in Materials Science · 1989 · 3.7K citations · Full text

The Effect of Cold-Work Distortion on X-Ray Patterns

Β. E. Warren, B. L. Averbach · Journal of Applied Physics · 1950 · 1.4K citations

Natural Sciences, Materials Engineering, Materials Science +16

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer et al. · Journal of Applied Crystallography · 1982 · 1.2K citations

Natural Sciences, Materials Engineering, Materials Science +16