Publication | Closed Access
On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials
270
Citations
22
References
1999
Year
Materials ScienceX-ray CrystallographyMaterials EngineeringNanocrystalline MaterialsEngineeringX-ray DiffractionApplied PhysicsMicrostructure-strength RelationshipGrain SizeNanocrystalline MaterialCrystallographyMicrostructureX-ray Fluorescence
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