Publication | Closed Access
Structure and properties of sputtered TiAl–M (M=Ag, Cr) thin films
19
Citations
7
References
1999
Year
Materials EngineeringMaterials ScienceThin Film PhysicsMaterial AnalysisEngineeringSurface ScienceApplied PhysicsThin Film MaterialsThin Film DevicesThin Film Process TechnologyThin FilmsEpitaxial GrowthSputtered Tial–mThin Film ProcessingThin-film Technology
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