Synchrotron Radiation Techniques for the Characterization of ${\rm Nb}_{3}{\rm Sn}$ Superconductors

Abstract

The high flux of high energy X-rays that can be provided through state-of-the-art high energy synchrotron beam lines has enabled a variety of new experiments with the highly absorbing Nb <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> Sn superconductors. We report different experiments with Nb <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> Sn strands that have been conducted at the ID15 High Energy Scattering beam line of the European Synchrotron Radiation Facility (ESRF). Synchrotron X-ray diffraction has been used in order to monitor phase transformations during <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">in-situ</i> reaction heat treatments prior to Nb <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> Sn formation, and to monitor Nb <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> Sn growth. Fast synchrotron micro-tomography was applied to study void growth during the reaction heat treatment of Internal Tin strands. The elastic strain in the different phases of fully reacted Nb <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> Sn composite conductors has been measured by high resolution X-ray diffraction during <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">in-situ</i> tensile tests.