IEEE Transactions on Electrical Insulation · 1990 · 145 citations · 5 references
ReliabilityElectrical EngineeringReliability EngineeringEngineeringElectrical Breakdown TestsFailure Data PointsReliability ModellingCivil EngineeringCumulative ProbabilityTime-dependent Dielectric BreakdownFailure AnalysisEngineering Failure AnalysisReliability PredictionOther Probability PaperExact TechniqueStatisticsFailure PredictionElectrical Insulation
Using both an exact technique and Monte Carlo simulations to estimate the cumulative probability of failure of the ith of n identically stressed samples, it is shown that the approximation F(i,n)=(i-0.3)/(n+0.4) is considerably more accurate than other commonly used approximations. The significance of this in the interpretation of electrical breakdown tests is demonstrated.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
5
Statistical Models and Methods for Lifetime Data.
Brian Francis, Jerald F. Lawless · Biometrics · 1983 · 2.8K citations
W. A. Thompson, Wayne Nelson · Journal of the American Statistical Association · 1983 · 1.5K citations