Dual-Mode Multiple-Band Digital Controller for High-Frequency DC–DC Converter

Abstract

An integrated digital controller design for dc-dc converter is proposed in this paper. The proposal presents a multiple- band dual-stage (MBDS) delay line A/D converter (ADC) for wide dynamic range of operation with reduced ripple, chip area, and power consumption. This proposal also introduces a novel folding logic for digital error calculation and dual-mode error control PID for improving transient response. A complete closed-loop experimental prototype is demonstrated on a field-programmable-gate- array-based setup. The feasibility and functionality of the proposed digital controller is verified with a closed-loop synchronous buck converter prototype that switches at 1 MHz and regulates over a wide output voltage range of 1.6-3.3 V. The proposed MBDS delay line ADC is fabricated with discrete logic gates and flip-flops. The integrated digital controller is also implemented using standard cell-based design methodology in 0.5-mum CMOS technology. The design reduces 33 % on-chip area compared to an equivalent of 64 tap delay line ADC. The complete digital controller chip takes less than 0.7 mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> of silicon area and consumes an average current of 92 muA at 1-MHz switching frequency. The voltage-mode digital loop achieves tracking time of less than 10 mus for 1-V step change of the reference voltage and settling time of 20 mus. Post layout simulation and experimental results are demonstrated.