Sub‐Micrometer Charge Modulation Microscopy of a High Mobility Polymeric n‐Channel Field‐Effect Transistor

Abstract

Electro-optical mapping of the charge density with sub-micrometer resolution can be obtained in a high mobility, top-gate n-channel polymer field-effect transistor by charge modulation microscopy. Local features on the 1 μm scale are unveiled and, using scanning transmission X-ray microscopy measurements, are attributed to structural variations within the polymeric film.