Substrate dependence of morphology in thin film polymer blends of polystyrene and poly(methyl methacrylate)

Abstract

We studied the effects of different substrates on the development of the morphologies in thin film polymer blends in as-spun and annealed films. We have utilized thin films of blends of polystyrene and poly(methyl methacrylate) spun cast on Si, Au and Co surfaces, and produced quantitative composition maps with near edge X-ray absorption fine structure (NEXAFS) microscopy as a function of annealing time. We observed a marked dependence of the morphologies and the qualitative dynamics on the surface composition. © 2000 Society of Chemical Industry