Comprehensive SEE characterization of 0.13µm flash-based FPGAs by heavy ion beam test

Abstract

Heavy-ion test results utilizing novel test methodologies of reprogrammable and non-volatile flash-based FPGAs are presented and discussed. The 5 programmable architectures in the A3P FPGA-family were tested: I/O structures, FPGA Core, PLL, FROM and SRAM.