IEEE Transactions on Nuclear Science · 1993 · 143 citations · 15 references
Natural SciencesNuclear EngineeringAtmospheric ChemistryAtmospheric ElectricityAtmospheric ScienceNeutron Transport TheorySolar RadiationCause-effect RelationsCause-effect RelationshipsNeutron FluxNeutron Flux MeasurementSingle Event EffectsSingle Event Upset ModelingStatic Random-access MemoryStatic Random-access Memory Design
The direct cause of single event upsets (SEUs) in static random-access memories (SRAMs) at aircraft altitudes by atmospheric neutrons has been documented previously. The variation of the in-flight SEU rate with latitude is demonstrated by new data over a wide range of geographical locations. Measurements and models of the atmospheric neutron flux are also evaluated to characterize its variation with altitude, latitude, and solar activity. The data confirm the validity of the initial conclusions of A. Taber and E. Normand (1993) regarding the cause/effect relationship between the atmospheric neutron flux and the measured SEU rate. The Wilson-Nealy atmospheric neutron model allows solar activity variations to be accounted for and is also more accurate in representing the nonseparable relationship between altitude and latitude variations.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Rate prediction for single event effects-a critique
E.L. Petersen, J.C. Pickel, James H. Adams et al. · IEEE Transactions on Nuclear Science · 1992 · 279 citations
Single event upset in avionics
Allison Taber, E. Normand · IEEE Transactions on Nuclear Science · 1993 · 216 citations
Engineering, Aerospace Engineering, Electrical Engineering +17