Characterization of crystal surfaces, thin films and superlattices by brillouin scattering from surface acoustic modes

Abstract

Abstract Surface acoustic waves on single crystals of Ge and Si, thin films of CoSi 2 and epitaxially grown CoSi 2 /Si superlattices on Si (111) are investigated by means of Brillouin scattering. The angular dispersion of the hypersonic surface waves localized at the surface was measured and used to determine the elastic tensor.