Transition density, a stochastic measure of activity in digital circuits

Abstract

Article Free Access Share on Transition density, a stochastic measure of activity in digital circuits Author: Farid N. Najm Semiconductor Process & Design Center, Texas Instruments Inc., MS 369, Dallas, Texas Semiconductor Process & Design Center, Texas Instruments Inc., MS 369, Dallas, TexasView Profile Authors Info & Claims DAC '91: Proceedings of the 28th ACM/IEEE Design Automation ConferenceJune 1991 Pages 644–649https://doi.org/10.1145/127601.127744Published:01 June 1991Publication History 225citation706DownloadsMetricsTotal Citations225Total Downloads706Last 12 Months38Last 6 weeks4 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF