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A Selective-Area Metal Bonding InGaAsP–Si Laser
44
Citations
21
References
2010
Year
Optical MaterialsEngineeringLaser ScienceLaser ApplicationsLaser MaterialOptoelectronic DevicesIntegrated CircuitsHigh-power LasersLaser ControlIngaasp StructureSemiconductor LasersLaser ManufacturingMaterials SciencePhotonicsElectrical EngineeringSi WaveguideLaser Processing TechnologyLaser DesignLaser-assisted DepositionAdvanced Laser ProcessingApplied PhysicsOptoelectronicsSelective-area Metal
A 1.55-μ m hybrid InGaAsP-Si laser was fabricated by the selective-area metal bonding method. Two Si blocking stripes, each with an excess-metals accommodated space, were used to separate the optical coupling area and the metal bonding areas. In such a structure, the air gap between the InGaAsP structure and Si waveguide has been reduced to be negligible. The laser operates with a threshold current density of 1.7 kA/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> and a slope efficiency of 0.05 W/A under pulsed-wave operation. Room-temperature continuous lasing with a maximum output power of 0.45 mW is realized.
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