Electronics Letters · 1983 · 19 citations · 1 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesDetector TechnologyHigh-frequency Semiconductor DevicesNoise In Electronic DevicesNoise In Semiconductor DevicesPhotodetectorsSemiconductor DetectorsAvalanche PhotodiodesBreakdown VoltageCutoff FrequencyExcess NoiseNoise In PhotodetectorsNoise In PhotodiodesPhotodiodesReceiver Sensitivity
A low-noise, low-dark-current and high-speed InGaAs avalanche photodiode (APD) has been designed and fabricated. The diode has a planar structure and is composed of InP/InGaAsP/InGaAs/InP layers grown on (111)A oriented InP. At a multiplication of 10, the diode exhibited excess noise factor of 5 and cutoff frequency of more than 1 GHz. Dark current was 10 nA near breakdown voltage. The diode has been tested in an experimental optical receiver in the gigabit range (time slot 0.63 ns) and 1.3 μm. The receiver sensitivity of −29.2 dBm was obtained at an error rate of 10−11.
1