Publication | Open Access
Point defect structures and energetics in Si using an empirical potential
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1993
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EngineeringTersoff 3Statics CalculationsSilicon On InsulatorDefect TolerancePoint Defect StructuresNanoelectronicsMaterials ScienceEmpirical PotentialPhysicsAtomic PhysicsSemiconductor MaterialSemiconductor Device FabricationDefect FormationMicroelectronicsSilicon DebuggingTersoff 2Surface ScienceApplied PhysicsCondensed Matter Physics
Statics calculations on silicon using the Tersoff 2 and Tersoff 3 potential energy functions are presented. We have evaluated the following at 0 K: (1) neutral monovacancy and divacancy formation and migration energies; (2) neutral bond-centered, site sharing, tetrahedral, and hexagonal self-interstitial formation and migration energies; and (3) the variation of these energies with distance from a bulk site of Frenkel defect formation and from [100] and [111] surfaces. The structural variations around these defects are also determined and discussed.