IEEE Transactions on Instrumentation and Measurement · 1989 · 26 citations · 5 references
EngineeringElectrical EngineeringHeat TransferPower ElectronicsThermal AnalysisHeat ConductionHeat Transfer AnalysisHeat Transfer FundamentalsHeat Transfer ModelingHigh-frequency Power ConversionAdmittance AnalysisSkin Effect LossesSystematic UncertaintiesThermal Impedance ModelingTransmission Line ModelingTransmission Line Theory
A model for a calculable AC-DC thermal transfer device is described. It is based on the transmission-line theory, augmented by corrections for skin effect and connection admittance. Experimental verification on four devices shows good to excellent agreement between the calculated and measured results. This enables the establishment of AC-DC transfer standards with total uncertainties ranging from less than 5 p.p.m. at 1 MHz to 100 p.p.m. at 30 MHz. Potential for extension to higher frequencies is discussed.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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