New Epstein Frame for Core Loss Measurements at High Frequencies and High Flux Densities

Abstract

This paper presents a new Epstein frame capable of core loss measurements on laminations subjected to high frequencies and high flux densities. The lamination characterization at high frequencies and high flux densities is mandatory in loss calculation procedure for high speed novel designs. The new 200- turn frame is compared with the 352-turn industrial standard frame and the recently developed 280-turn frame. The 200-turn frame core loss results show the ability of the frame to reach higher flux densities than the other two frames. The 280-turn frame core loss results have also been extended from 1 kHz to 6 kHz.