A critical evaluation of pressure scales at high temperatures by in situ X-ray diffraction measurements - Concepedia

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A critical evaluation of pressure scales at high temperatures by in situ X-ray diffraction measurements

140

Citations

28

References

2004

Year

Yingwei Fei, Jie Li, Kei Hirose, W. G. Minarik, James A. Van Orman, C. Sanloup, W. van Westrenen, Tetsuya Komabayashi, K. Funakoshi

Physics of The Earth and Planetary Interiors

Materials ScienceHigh Hydrostatic PressureEngineeringPressure ScalesX-ray DiffractionApplied PhysicsExperimental ThermodynamicsSolid MechanicsHigh TemperaturesThermophysicsThermodynamicsCritical EvaluationMicrostructure

References

	Year	Citations

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