RoRA: a reliability-oriented place and route algorithm for SRAM-based FPGAS

Abstract

SRAM-based FPGA designs are extremely susceptible to single event upset (SEUs). Since the configuration memory defines which is the circuit an SRAM-based field programmable gate array (FPGA) implements, any change induced by SEUs in the configuration memory may modify drastically the implemented circuit. When such devices are used in safety-critical applications, fault tolerant techniques are needed able to mitigate the effects of SEUs in FPGA's configuration memory. In this paper we present a reliability-oriented place and route algorithm that is able to mitigate the effects of the considered upsets.