Anomalous X‐ray Line Broadening Observed in γ‐Fe ₂ O ₃ Derived from γ‐FeOOH

Abstract

Defect structure of fine‐grained γ‐Fe 2 O 3 powder obtained by dehydroxylation of y‐FeOOH powder has been studied by X‐ray diffraction and high‐resolution electron micrographs. An anomalous X‐ray line broadening was observed in the γ‐Fe 2 O 3 powder. It is found that the X‐ray line breadth is dependent on the crystal structure factors of each reflection line: the reflections from net planes consisting of only metal ions on tetrahedral sites and octahedral sites of spinel structure are much broader than those from net planes including oxygen ions. The anomalous X‐ray line broadening is explained on the basis of stacking faults in the spinel structure.