MOCVD and MOD of YBCO and Buffer Layers on Textured Metal Tapes

Abstract

Different layer architectures produced by only MOD, only MOCVD and combinations of MOD buffers and MOCVD YBCO are presented. RTR MOCVD-YBCO layers obtained on MOD-CeO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> /MOD-LZO/Ni5 at%W tapes demonstrate critical current densities up to 2 MA/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> at 77 K. On single LZO (50-100 nm) buffered Ni5 at%W tapes from Nexans Superconductors and on RTR MOCVD buffer layers critical current densities between 0.8 and 1.3 MA/cm are obtained. RTR MOD-LZO layers often show delamination during YBCO deposition. Preannealing treatment before YBCO deposition allows to avoid this. Tapes up to 10 m are produced by combination of MOD-LZO and RTR MOCVD-YBCO.