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ToF-SIMS study of alternate polyelectrolyte thin films: Chemical surface characterization and molecular secondary ions sampling depth

DOI

87

Citations

17

References

1996

Year

Arnaud Delcorte, P. Bertrand, X. Arys, Alain M. Jonas, Erik Wischerhoff, Bernd Mayer, André Laschewsky
Surface Science

References

YearCitations

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