Journal of Applied Crystallography · 2014 · 335 citations · 31 references
Natural SciencesChemistryAnalytical ChemistryRadiation DetectionSpectroscopyData ReductionScattering AnalysisSmall-angle ScatteringX-ray CrystallographyX-ray Data AnalysisX-ray DiffractionCrystallographic Data ReductionData ProcessingData Reduction PipelinesDiffraction Data ProcessingOpen-source Software DevelopmentSmall-angle X-ray ScatteringSmall-angle X-ray Scattering AnalysisSynchrotron X-ray Scattering
Synchrotron X‑ray scattering generates massive data sets, making rapid, tailored processing essential for efficient analysis and real‑time experimental optimization. This work introduces an open‑source software package designed to handle large volumes of synchrotron scattering data. The package performs calibration, correction, one‑ or two‑dimensional integration, fitting, and parameter extraction to streamline data reduction and analysis.
X-ray scattering experiments at synchrotron sources are characterized by large and constantly increasing amounts of data. The great number of files generated during a synchrotron experiment is often a limiting factor in the analysis of the data, since appropriate software is rarely available to perform fast and tailored data processing. Furthermore, it is often necessary to perform online data reduction and analysis during the experiment in order to interactively optimize experimental design. This article presents an open-source software package developed to process large amounts of data from synchrotron scattering experiments. These data reduction processes involve calibration and correction of raw data, one- or two-dimensional integration, as well as fitting and further analysis of the data, including the extraction of certain parameters. The software,
31
Bharat Bhushan · 2016 · 3.8K citations
Natural Sciences, Chemistry, Physics +17
Anomalous Surface Reflection of X Rays
Yasuharu Yoneda · Physical Review · 1963 · 665 citations