Publication | Closed Access
Dielectric response of structured multilayered polymer films fabricated by forced assembly
79
Citations
17
References
2008
Year
DielectricsEngineeringDielectric LossPolymer NanocompositesConducting PolymerPolymer MaterialPolymer TechnologyPolymer ProcessingDielectric ResponseDielectric StrengthPolymer ChemistryMaterials ScienceMultilayer MicrostructurePolymer EngineeringSemiconducting PolymerSelf-assemblyPolymer ScienceApplied PhysicsPolymer CharacterizationPolymer PropertyPolymer Self-assemblyElectrical Insulation
The effect of introducing a multilayer microstructure on the dielectric properties of polymer materials is evaluated in 32- and 256-layer films with alternating polycarbonate (PC) and polyvinylidene-hexafluoropropylene (coPVDF) layers. The permittivity, dielectric loss, dielectric strength, and energy density were measured as a function of the relative PC/coPVDF volume concentrations. The permittivity follows an effective medium model while the dielectric strength was typically higher than that predicted by a volume fraction based weighted average of the components. Energy densities as high as ∼14J∕cm3, about 60% greater than that of the component polymers, are measured for 50% PC/50% coPVDF films.
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