IEEE Transactions on Instrumentation and Measurement · 2013 · 27 citations · 17 references
ComputingElectrical EngineeringInstrumentationMicroelectronicsUncertainty QuantificationError EstimationMeasurement ErrorMeasurement UncertaintyPropagation Of UncertaintyUncertainty AnalysisUncertainty EstimationExperimental Uncertainty AnalysisMeasurement Uncertainty EvaluationModel Error EstimationOn-wafer MeasurementOn-wafer Measurement TechniquesParameter Estimation UncertaintyParameter Uncertainty AnalysisParameter Uncertainty Quantification
An experimental analysis of on-wafer S-parameter uncertainties is presented. Recently, two different approaches, based either on differential numerical programming or on a fully analytical solution, have been introduced. In order to establish their suitability, a careful comparison is given for on-wafer measurements. Through this comparison, possible limitations and causes of errors are also highlighted. Finally, the uncertainty evaluation of the 16-term error model is presented for the first time.
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Arkadiusz Lewandowski, Dylan F. Williams, Paul D. Hale et al. · IEEE Transactions on Microwave Theory and Techniques · 2010 · 91 citations