A Method For Fine Resolution Frequency Estimation From Three DFT Samples

Abstract

The parameter estimation of a complex exponential waveform observed under white noise is typically tackled in two stages. In the first stage, a coarse frequency estimate is found by the application of an N-point DFT to the input of length <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">N</i> . In the second stage, a fine search around the peak determined in the first stage is conducted. The method proposed in this paper presents a simpler alternative. The method suggests a nonlinear relation involving three DFT samples already calculated in the first stage to produce a real valued, fine resolution frequency estimate. The estimator approaches Jacobsen's estimator for large <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">N</i> and presents a bias correction which is especially important for small and medium values of <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">N</i> .