Determination of crystallinity in polyethylene by X‐ray diffractometer

Abstract

Abstract A convenient and rapid x‐ray diffraction method is described for the determination of per cent crystallinity in polyethylene, using a scanning goniometer with Geiger tube and scaler counter. Results are presented on per cent crystallinities of a number of polyethylenes and on samples made by quenching polyethylene melt at different temperatures in the range of 20–102°C. The samples of polyethylene studied were found to have 65‐71% crystallinity. The temperature at which plyethylene melt is quenched has no appreciable effect on the crystalline content.