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Thin Hf<sub><i>x</i></sub>Zr<sub>1‐<i>x</i></sub>O<sub>2</sub> Films: A New Lead‐Free System for Electrostatic Supercapacitors with Large Energy Storage Density and Robust Thermal Stability
334
Citations
21
References
2014
Year
Materials ScienceElectrical EngineeringSupercapacitorsEnergy Storage DensityEngineeringFerroelectric ApplicationApplied PhysicsElectrostatic SupercapacitorsNew Lead‐free SystemEnergy StorageSupercapacitorEnergy Storage DeviceThin FilmsField Cycling 109Energy MaterialLead-free PerovskitesHf0.3zr0.7o2 CapacitorRobust Thermal Stability
The promising energy storage properties of new lead-free antiferroelectric HfxZr1-xO2 (x = 0.1–0.4) films with high energy storage density are reported. The energy storage density of the Hf0.3Zr0.7O2 capacitor does not decrease with the increase in temperature up to 175 °C, and it decreases by only ≈4.5% after field cycling 109 times.
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