New Method of Double-Crystal X-Ray Diffractrometric Determination of the Strained State in Surface-Layer Structures

Abstract

A new method to determine the strained state in surface-layer structures of any crystallographic system using double-crystal X-ray diffractometry is proposed. The possibility to calculate all six components of the strain tensor and in general case all three components of the rotation tensor is demonstrated. The strained state in ion exchanged H:LiNbO3 and Me: LiTaO3 structures is determined. [Russian Text Ignored.]