Temperature dependence of the Raman spectra of Bi<sub>2</sub>Te<sub>3</sub> and Bi<sub>0.5</sub>Sb<sub>1.5</sub>Te<sub>3</sub> thermoelectric films

Duanhui Li, Liangliang Li, Dawei Liu, Jing‐Feng Li

physica status solidi (RRL) - Rapid Research Letters · 2012 · 30 citations · 25 references

Concepts

Abstract

Abstract The temperature dependence of the Raman spectra of Bi 2 Te 3 and Bi 0.5 Sb 1.5 Te 3 thermoelectric films was investigated. The temperature coefficients of the E g (2) peak positions were determined as –0.0137 cm –1 /°C and –0.0156 cm –1 /°C, respectively. The thermal expansion of the crystal caused a linear shift of the Raman peak induced by the temperature change. Based on the linear relation, a reliable and noninvasive micro‐Raman scattering method was shown to measure the thermal conductivity of the thermoelectric films. (© 2012 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)

References

25