Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis—importance of epoxy impregnation - Concepedia

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Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis—importance of epoxy impregnation

150

Citations

9

References

2003

Year

Knut O. Kjellsen, A Monsøy, K Isachsen, Rachel J. Detwiler

Cement and Concrete Research

Materials ScienceChemical EngineeringEngineeringElectron MicroscopyMicroscopyEpoxy ImpregnationMicroanalysisSem-backscattered Electron ImagingFlat-polished SpecimensMicrostructureX-ray Imaging

References

	Year	Citations

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