IEEE Transactions on Circuits and Systems · 1982 · 58 citations · 19 references
EngineeringElectrical EngineeringSystems EngineeringAnalog ElectronicsFault-tolerant SystemsMicroelectronicsDesign For TestabilityDiagnosisDiagnosticsFault DetectionFault DiagnosisFault ModelingAnalog Built-in Self-testAnalog TestabilityBuilt-in Self-test For Analog CircuitsCascading FailuresFault Diagnosis For Nonlinear SystemsHardware Fault DetectionNonlinear SystemsReplaceable Components
A simulation-after-test algorithm for the analog fault diagnosis problem is proposed in which a bound on the maximum number of simultaneous failures is used to minimize the number of test points required. The resultant algorithm is applicable to both linear and nonlinear systems with multiple hard or soft faults and can be used to isolate failures up to an arbitrarily specified "replaceable chip or subsystem."
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