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Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

Materials ScienceComposition VariationsIi-vi SemiconductorX-ray SpectroscopyEngineeringNanomaterialsNanotechnologyX-ray DiffractionApplied PhysicsThin FilmsCu2znsnse4 Thin Films