IEEE Transactions on Nuclear Science · 2002 · 111 citations · 13 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsHeat TransferSemiconductor MaterialsCrystal EngineeringCrystal GrowthCrystallization ProcessesSemiconductor Crystal GrowthSemiconductor DetectorsCarrier Mobility-lifetime ProductElectrical CompensationElectrical ResistivityRadiation Detector MaterialsRadiative Heat LossSingle-crystal GrowthThermal StabilityThermal Stability Enhancement
The growth of large-volume semi-insulating CdZnTe single crystals with improved structural perfection has been demonstrated by the electrodynamic gradient (EDG) technique and active control of the Cd partial pressure in the ampoule. The EDG furnace nearly completely eliminates the uncontrolled radiative heat transport commonly encountered in traditional Bridgman systems where the charge and furnace move relative to each other. Since the new furnace utilizes electronically controlled high-precision gradient translation, it achieves superior thermal stability throughout the growth. The control of the Cd partial pressure allowed the solidification and cool-down of the ingots close to the stoichiometric composition. As a result, the formation and incorporation of large-size (/spl ges/1 /spl mu/m diameter) Te inclusions was avoided during crystallization and ingots with high structural perfection were achieved. Adequate electrical compensation has been achieved in most of the crystal growth experiments yielding CdZnTe crystals with bulk electrical resistivity in the 10/sup 9/-10/sup 10/ /spl Omega//spl middot/cm range and electron mobility-lifetime product as high as /spl mu//spl tau//sub e/=1.2/spl times/10/sup -3/ cm/sup 2//V. The materials exhibit good spectral performance in the parallel plate detector configuration.
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Deep energy levels in CdTe and CdZnTe
A. Castaldini, A. Cavallini, Beatrice Fraboni et al. · Journal of Applied Physics · 1998 · 299 citations · Full text
Properties of CdZnTe crystals grown by a high pressure Bridgman method
F. Patrick Doty, J.F. Butler, J. F. Schetzina et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1992 · 181 citations
Natural Sciences, Materials Engineering, Materials Science +16