Sharp reduction of the secondary electron emission yield from grooved surfaces

Abstract

The effect of an artificially enhanced rough surface on the secondary electron yield (SEY) was investigated both theoretically and experimentally. Analytical studies on triangular and rectangular grooved surfaces show the connection between the characteristic parameters of a given geometry to the SEY reduction. The effect of a strong magnetic field is also discussed. SEY of grooved samples have been measured and the results agree with particle simulations using a Monte Carlo approach.