The Self-adjusting File (SAF). Part 3: Removal of Debris and Smear Layer—A Scanning Electron Microscope Study - Concepedia

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Publication | Open Access

The Self-adjusting File (SAF). Part 3: Removal of Debris and Smear Layer—A Scanning Electron Microscope Study

DOI Full Paper Access

153

Citations

20

References

2010

Year

Zvi Metzger, Ehud Teperovich, Raphaela Cohen, Raviv Zary, Frank Paqué, Michael Hülsmann

Journal of Endodontics

Self-adjusting FileMicroscopy

References

	Year	Citations

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