Wavefront-flatness evaluation by wavefront-correlation-information-entropy method and its application for adaptive confocal microscope

Yoshiaki Yasuno, Tobias Wiesendanger, Aiko Ruprecht, Shuichi Makita, Toyohiko Yatagai, Hans J. Tiziani

Optics Communications · 2004 · 22 citations · 11 references

Concepts

References

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